Industry Development of routines for simultaneous in situ chemical composition
Extending the capabilities to a more comprehensive elemental composition analysis has a huge potential for new
Industry Silicon-29 Magnetic Resonance Spectroscopy
²⁹Si NMR refers to a powerful spectroscopy technique used to probe the structural environments of silicon-containing materials,
Industry A re-examination of thin-film silicon''s Raman spectrum
Seven basic steps are suggested in order to acquire the Raman spectrum associated with a given sample of thin-film
Industry Performing elemental microanalysis with high accuracy and high
Electron-excited X-ray microanalysis performed in the scanning electron microscope with energy-dispersive X-ray
Industry FTIR Measurement: Silicon Wafers for Infrared Spectroscopy
Learn what an FTIR measurement is and how to choose silicon wafers for mid-IR transmission. Compare undoped (intrinsic/FZ) vs
Industry Silicon as a standard material for infrared reflectance and
The measured values agree with the expected values obtained from the published index of refraction of Si to within
Industry New insight on the role of localisation in the electronic
New angle-resolved photoelectron spectroscopy (ARPES) data, recorded at several different photon energies from the
Industry Spectrometer
Spectrometer An XPS spectrometer A spectrometer (/ spɛkˈtrɒmɪtər /) is a scientific instrument used to separate and measure
Industry Secondary-ion mass spectrometry
Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by
Industry Raman Analysis of Si Crystallinity
In this application note, we evaluate how a portable Raman spectrometer can be used in conjunction with a portable
Industry Decoupled measurement of silicon-based film and
In this study, to simultaneously analyze multilayer films with significant thickness differences, a hybrid reflectance
Industry Stress Measurements in Si and SiGe by Liquid-Immersion Raman Spectroscopy
In this section, the methodology of measurements for anisotropic biaxial stress states in Si by liquid-immersion Raman spectroscopy
Industry Measurement of Si-OH content in fused silica with
Fourier transform infrared (FTIR) spectroscopy Si-OH group is widely used in Si-OH content measurement of fused
Industry Quantitative analysis of Si by means of ICP-OES
Quantitative analysis of Si by means of ICP-OES Inductively coupled plasma–optical emission spectrometry (ICP-OES) is widely
Industry Raman Spectroscopy
Strain measurements of a Si cap layer deposited on a SiGe substrate determination of Ge content Introduction Raman spectroscopy
Industry Refractive-index measurement of Si at
The refractive index of silicon at $ensuremath{gamma}$-ray energies from 181 to 1959 keV was investigated using
Industry Frontiers | Comparing silicon mineral species of different
While Fourier transform infrared spectroscopy (FTIR) in the mid-infrared range can differentiate between short-range
Industry Determination of refractive index of crystalline silicon in the
The precise values of the refractive index of crystalline silicon are determined in the infrared region based on the
Industry Silicon stress measurements by Raman spectroscopy
Raman spectroscopy is a technique that has become increasingly popular for stress measurements in semiconductors, because it
Industry Quantitative determination of hydrogen concentration in silicon nitride
N-H and Si-H have unique IR absorption bands at 3350 cm-1 (N-H stretching) and 2170 cm-1 (Si-H stretching) regions, respectively.
Industry Atomic absorption spectroscopy
Atomic absorption spectrometer block diagram An atomic absorption spectrometer contains many components such as the
Industry Photoelectron spectroscopy studies of SiO2/Si interfaces
The results are obtained thanks to the progress of measurement techniques, such as angle-resolved measurements,
Industry Spectral aspects of the determination of Si in organic and aqueous
Abstract High-resolution continuum source flame atomic absorption spectrometry (HR-CS FAAS) was applied to reveal
Industry Evaluating Silicon using Raman Microscopy
This review is not intended to be all-inclusive of everything that can be done with Raman spectroscopy in terms of the analysis of
Industry Spectrometer
Optical emission spectrometers (often called "OES or spark discharge spectrometers"), are used to evaluate metals to determine the
Industry In situ determination of precise stable Si isotope ratios by UV
A new method for the in situ measurement of stable Si isotope ratio using UV-femtosecond laser ablation connected
Industry Silicon Stable Isotope Analysis of Natural Aqueous and Solid
The stable isotope composition of silicon (Si) bears the potential to trace a variety of (bio)geochemical processes in the
Industry EELS Measurement of Silicon (Si)
Figure 3441f shows the Si L 2,3 EEL spectra of Si, SiO 2 and Si 3 N 4. The positions of the edge onsets clearly indicate chemical